epotyom commented on code in PR #16510:
URL: https://github.com/apache/lucene/pull/16510#discussion_r3913129229
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lucene/core/src/test/org/apache/lucene/search/TestIndexSortSortedNumericDocValuesRangeQuery.java:
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@@ -685,6 +690,91 @@ private Query createQuery(String field, long lowerValue,
long upperValue) {
field, lowerValue, upperValue, fallbackQuery);
}
+ public void testBoundedIteratorIntoBitSet() throws Exception {
Review Comment:
If I'm reading this right, the test is mainly checking two things: that
intoBitSet is overridden and that BoundedDocIdSetIterator is what we end up
with for sparse ranges. Would it be worth adding unit tests for
BoundedDocIdSetIterator directly instead, so we can assert the bits it produces
rather than just that the call gets forwarded? It would need to become package
private for that, though. WDYT?
##########
lucene/core/src/test/org/apache/lucene/util/TestNotDocIdSet.java:
##########
@@ -55,6 +78,25 @@ public void testRandomDocIDRunEnd() throws IOException {
}
}
+ public void testIntoBitSetFullBlockComplement() throws IOException {
Review Comment:
I'm curious what are the cases that this test covers and
testIntoBitSetDenseComplement doesn't?
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