Jonathan Wright writes:
> Hi,
>
> Some scan-assembler tests for SVE code generation were erroneously
> split over multiple lines - meaning they became invalid. This patch
> gets the tests working again by putting each test on a single line.
>
> The extract_[1234].c tests are corrected to expect th
Hi,
Some scan-assembler tests for SVE code generation were erroneously
split over multiple lines - meaning they became invalid. This patch
gets the tests working again by putting each test on a single line.
The extract_[1234].c tests are corrected to expect that extracted
32-bit values are moved
