Hi, Some scan-assembler tests for SVE code generation were erroneously split over multiple lines - meaning they became invalid. This patch gets the tests working again by putting each test on a single line.
The extract_[1234].c tests are corrected to expect that extracted
32-bit values are moved into 'w' registers rather than 'x' registers.
Ok for master?
Thanks,
Jonathan
---
gcc/testsuite/ChangeLog:
2021-08-06 Jonathan Wright <jonathan.wri...@arm.com>
* gcc.target/aarch64/sve/dup_lane_1.c: Don't split
scan-assembler tests over multiple lines. Expect 32-bit
result values in 'w' registers.
* gcc.target/aarch64/sve/extract_1.c: Likewise.
* gcc.target/aarch64/sve/extract_2.c: Likewise.
* gcc.target/aarch64/sve/extract_3.c: Likewise.
* gcc.target/aarch64/sve/extract_4.c: Likewise.
rb14768.patch
Description: rb14768.patch
