On Thu, Aug 20, 2015 at 11:37 AM, Dominik Vogt wrote:
> This patch fixes an annoying problem of the dg-final test using the
> scan-assembler family of tests (and maybe others). For a test
> file, the option "-ffat-lto-objects" is added to the command line
> once for each "scan-assembler" test, ev
Vogt
Date: Thu, 20 Aug 2015 10:26:17 +0100
Subject: [PATCH] Add extra compile options for dg-final only once.
A file with many scan-assembler* tests used to add -ffat-lto-objects to the
command line many times, eventually rendering it unreadable.
---
gcc/testsuite/lib/gcc-dg.exp | 2 +-
1 file cha
