On Thu, Aug 20, 2015 at 11:37 AM, Dominik Vogt <v...@linux.vnet.ibm.com> wrote: > This patch fixes an annoying problem of the dg-final test using the > scan-assembler family of tests (and maybe others). For a test > file, the option "-ffat-lto-objects" is added to the command line > once for each "scan-assembler" test, eventually resulting in an > unreadable command line. > > Can this be committed?
Yes. Thanks, Richard. > Ciao > > Dominik ^_^ ^_^ > > -- > > Dominik Vogt > IBM Germany
