Re: [lldb-dev] serialized, low-load test pass in parallel test runner

2015-11-27 Thread Pavel Labath via lldb-dev
I think it sounds like something that would be useful in general. I'd even go a step further and say that we can replace the current flakey test mechanism with your proposed solution. If we do that (remove the current flakey mechanism when this is in place), then I think it would be super-great as

Re: [lldb-dev] serialized, low-load test pass in parallel test runner

2015-11-27 Thread Reid Kleckner via lldb-dev
Chromium's test framework uses the same technique. It has the potential to really slow things down if you have a lot of failing tests. You might want some kind of threshold for giving up, I.e. here's 50 failures, I'll stop running the rest so devs see results sooner. Otherwise, yeah, this seems re

Re: [lldb-dev] serialized, low-load test pass in parallel test runner

2015-11-27 Thread Todd Fiala via lldb-dev
Note this is similar to the flakey test mechanism, with the primary difference being that the re-run is done in a minimal CPU load environment rather than wherever the failure first occurred. The existing flakey test rerun logic is not helpful for the high-load-induced failures that I'm looking to

[lldb-dev] serialized, low-load test pass in parallel test runner

2015-11-27 Thread Todd Fiala via lldb-dev
Hi all, On OS X (and frankly on Linux sometimes as well, but predominently OS X), we have tests that will sometimes fail when under significant load (e.g. running the concurrent test suite, exacerbated if we crank up the number of threads, but bad enough if we run at "number of concurrent workers