On Mon, Jul 22, 2013 at 1:12 PM, Bill Schmidt
wrote:
> In little-endian mode, the field selected for use in a vector splat is
> numbered differently than in big-endian mode. This patch corrects the
> code generated for little-endian. This addresses 45 test failures when
> running the test-suite
In little-endian mode, the field selected for use in a vector splat is
numbered differently than in big-endian mode. This patch corrects the
code generated for little-endian. This addresses 45 test failures when
running the test-suite in little-endian mode.
Bootstrapped and tested on powerpc64-u
