[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2017-06-19 Thread rearnsha at gcc dot gnu.org
https://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 Richard Earnshaw changed: What|Removed |Added Status|NEW |RESOLVED Resolution|---

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-08-02 Thread ramrad01 at arm dot com
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #15 from ramrad01 at arm dot com 2012-08-02 10:10:47 UTC --- On 08/02/12 00:35, janis at gcc dot gnu.org wrote: > http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 > > --- Comment #14 from Janis Johnson 2012-08-01 > 23:35:12 UTC --- >

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-08-01 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #14 from Janis Johnson 2012-08-01 23:35:12 UTC --- Ramana, chunks of regular expressions within parentheses are matched and added to the returned expression that is used in scan-assembler-times. To avoid returning parenthesized bits

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-31 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #13 from Janis Johnson 2012-07-31 18:01:55 UTC --- The scan-assembler finds the expression at least once and passes. The scan-assembler-times directive expects to find the expression twice, but the returned match is 5 lines, not 2.

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-31 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #12 from Ramana Radhakrishnan 2012-07-31 17:56:29 UTC --- (In reply to comment #8) > For some reason I couldn't apply the patch, but manually changed the tests to > use { scan-assembler-times regexp 2 } instead of { scan assembler re

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-31 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #11 from Janis Johnson 2012-07-31 17:30:15 UTC --- Sorry, I had been assuming that the tests in our tree match what's upstream but the expressions to match are slightly different. I'll keep investigating.

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-31 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #10 from Janis Johnson 2012-07-31 16:49:23 UTC --- The problem is the regular expression, which matches far too much text and ends up with a length of 5 instead of 2.

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-31 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #9 from Ramana Radhakrishnan 2012-07-31 16:16:11 UTC --- (In reply to comment #8) > For some reason I couldn't apply the patch, but manually changed the tests to > use { scan-assembler-times regexp 2 } instead of { scan assembler rege

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-31 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #8 from Janis Johnson 2012-07-31 15:56:12 UTC --- For some reason I couldn't apply the patch, but manually changed the tests to use { scan-assembler-times regexp 2 } instead of { scan assembler regexp }. Ramana, have you tried runnin

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-30 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #7 from Ramana Radhakrishnan 2012-07-31 00:04:58 UTC --- (In reply to comment #5) > Thanks for looking, Ramana. I noticed in my investigation that the search > string needs to be different for scan-assembler-times than for scan-assem

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-30 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #6 from Ramana Radhakrishnan 2012-07-31 00:00:36 UTC --- Created attachment 27901 --> http://gcc.gnu.org/bugzilla/attachment.cgi?id=27901 Tentative patch. Tentative patch - has a few unneeded whitespace changes but probably fixes t

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-30 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #5 from Janis Johnson 2012-07-30 18:34:50 UTC --- Thanks for looking, Ramana. I noticed in my investigation that the search string needs to be different for scan-assembler-times than for scan-assembler, since the regular expression h

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-07-30 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #4 from Ramana Radhakrishnan 2012-07-30 18:30:40 UTC --- (In reply to comment #0) > Tests gcc/testsuite/gcc.target/arm/neon/v*.c are generated by the script > gcc/config/arm/neon-testgen.ml. 54 of these tests have duplicate > scan-

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-06-20 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #3 from Ramana Radhakrishnan 2012-06-20 14:59:33 UTC --- (In reply to comment #2) > Two scan-assembler directives with the same search string don't look for two > instances of the same string, they just look for the same thing twice a

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-06-20 Thread janis at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 --- Comment #2 from Janis Johnson 2012-06-20 14:15:52 UTC --- Two scan-assembler directives with the same search string don't look for two instances of the same string, they just look for the same thing twice and pass if that string only occurs o

[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

2012-06-20 Thread ramana at gcc dot gnu.org
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664 Ramana Radhakrishnan changed: What|Removed |Added Status|UNCONFIRMED |NEW Last reconfirmed|