Re: [dpdk-dev] [PATCH v8 0/3] generic spinlock optimization and test case enhancements

2019-03-28 Thread Thomas Monjalon
> Gavin Hu (3): > test/spinlock: remove 1us delay for correct benchmarking > test/spinlock: amortize the cost of getting time > spinlock: reimplement with atomic one-way barrier builtins Applied, thanks

Re: [dpdk-dev] [PATCH v8 0/3] generic spinlock optimization and test case enhancements

2019-03-15 Thread Ananyev, Konstantin
> > V8: Remove internal ChangeId > > V7: Update the 1/3 patch headline and commit message > > V6: Rebase and drop the first patch as a similar fix was already merged. > > V5: Remove ChangeId(sorry for that) > > V4: > 1. Drop one patch for the test case to get time precisely as the overhead

Re: [dpdk-dev] [PATCH v8 0/3] generic spinlock optimization and test case enhancements

2019-03-11 Thread Nipun Gupta
> -Original Message- > From: Gavin Hu [mailto:gavin...@arm.com] > Sent: Friday, March 8, 2019 1:27 PM > To: dev@dpdk.org > Cc: n...@arm.com; tho...@monjalon.net; jer...@marvell.com; Hemant > Agrawal ; Nipun Gupta > ; honnappa.nagaraha...@arm.com; > gavin...@arm.com; i.maxim...@samsung.com;

[dpdk-dev] [PATCH v8 0/3] generic spinlock optimization and test case enhancements

2019-03-07 Thread Gavin Hu
V8: Remove internal ChangeId V7: Update the 1/3 patch headline and commit message V6: Rebase and drop the first patch as a similar fix was already merged. V5: Remove ChangeId(sorry for that) V4: 1. Drop one patch for the test case to get time precisely as the overhead of getting time is amor