Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest

2019-07-19 Thread Parthasarathy, JananeeX M
...@redhat.com >Subject: Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest > >Still no review for this patch? > >20/01/2019 22:25, Thomas Monjalon: >> Any review please? >> >> 29/11/2018 08:36, Jananee Parthasarathy: >> > Reduced test time

Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest

2019-07-04 Thread Thomas Monjalon
Still no review for this patch? 20/01/2019 22:25, Thomas Monjalon: > Any review please? > > 29/11/2018 08:36, Jananee Parthasarathy: > > Reduced test time for efd_autotest. > > Key length is updated, invoke times of random function is reduced. > > Different value is updated for each hash key entr

Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest

2019-01-20 Thread Thomas Monjalon
Any review please? 29/11/2018 08:36, Jananee Parthasarathy: > Reduced test time for efd_autotest. > Key length is updated, invoke times of random function is reduced. > Different value is updated for each hash key entry. > > Signed-off-by: Jananee Parthasarathy > --- > v3: reverted the simple_ke

[dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest

2018-11-28 Thread Jananee Parthasarathy
Reduced test time for efd_autotest. Key length is updated, invoke times of random function is reduced. Different value is updated for each hash key entry. Signed-off-by: Jananee Parthasarathy --- v3: reverted the simple_key to uint8_t type v2: value updated for each hash key --- test/test/test_e