Hi Carl,
I committed the be/le selectors.
On Mon, May 21, 2018 at 08:15:30AM -0700, Carl Love wrote:
> --- a/gcc/testsuite/gcc.target/powerpc/builtins-1-be.c
> +++ b/gcc/testsuite/gcc.target/powerpc/builtins-1-be.c
> @@ -1,4 +1,4 @@
> -/* { dg-do compile { target { powerpc64-*-* } } } */
> +/* { dg-do compile { target { powerpc*-*-* && be } } } */
Does this (and other similar tests) work on 32-bit as well?
> --- /dev/null
> +++ b/gcc/testsuite/gcc.target/powerpc/builtins-3-le.c
> @@ -0,0 +1,77 @@
> +/* { dg-do compile { target powerpc64le-*-* } } */
> +/* { dg-require-effective-target powerpc_altivec_ok } */
> +/* { dg-options "-maltivec" } */
This now should be powerpc*-*-* && le, possibly with && lp64 (but I don't
think we care about 32-bit LE in any of the rest of the testsuite; many
tests will fail there, so I wouldn't bother).
With the be/le selectors available, does it help to split the tests into
two still, or can things be better done with just one test, and be/le
selectors on each scan-assembler-times that needs one?
Segher
