The attached patch fixes
https://gcc.gnu.org/bugzilla/show_bug.cgi?id=79916
The PR is about LRA cycling on some tests when SD data are used. The
problem was in that actual assigned reg to pseudo was not in the pseudo
preferred class and this resulted in wrong generated code which LRA
tried to change again and again.
The patch was successfully bootstrapped and tested on ppc64 (gcc110).
Is it ok to commit?
Index: ChangeLog
===================================================================
--- ChangeLog (revision 259376)
+++ ChangeLog (working copy)
@@ -1,3 +1,10 @@
+2018-04-13 Vladimir Makarov <vmaka...@redhat.com>
+
+ PR rtl-optimization/79916
+ * config/rs6000/rs6000.c (rs6000_emit_move): Use assigned hard
+ regs (if any) to define how to gnerate SD moves when LRA is in
+ progress.
+
2018-04-13 Jan Hubicka <hubi...@ucw.cz>
Bin Cheng <bin.ch...@arm.com>
Index: testsuite/ChangeLog
===================================================================
--- testsuite/ChangeLog (revision 259376)
+++ testsuite/ChangeLog (working copy)
@@ -1,3 +1,8 @@
+2018-04-13 Vladimir Makarov <vmaka...@redhat.com>
+
+ PR rtl-optimization/79916
+ * gcc.target/powerpc/pr79916.c: New.
+
2018-04-13 Andrey Belevantsev <a...@ispras.ru>
PR rtl-optimization/83852
Index: config/rs6000/rs6000.c
===================================================================
--- config/rs6000/rs6000.c (revision 259330)
+++ config/rs6000/rs6000.c (working copy)
@@ -10610,7 +10610,7 @@ rs6000_emit_move (rtx dest, rtx source,
if (regno >= FIRST_PSEUDO_REGISTER)
{
cl = reg_preferred_class (regno);
- regno = cl == NO_REGS ? -1 : ira_class_hard_regs[cl][1];
+ regno = reg_renumber[regno] >= 0 ? reg_renumber[regno] : cl == NO_REGS ? -1 : ira_class_hard_regs[cl][1];
}
if (regno >= 0 && ! FP_REGNO_P (regno))
{
@@ -10635,7 +10635,7 @@ rs6000_emit_move (rtx dest, rtx source,
{
cl = reg_preferred_class (regno);
gcc_assert (cl != NO_REGS);
- regno = ira_class_hard_regs[cl][0];
+ regno = reg_renumber[regno] >= 0 ? reg_renumber[regno] : ira_class_hard_regs[cl][0];
}
if (FP_REGNO_P (regno))
{
@@ -10664,7 +10664,7 @@ rs6000_emit_move (rtx dest, rtx source,
if (regno >= FIRST_PSEUDO_REGISTER)
{
cl = reg_preferred_class (regno);
- regno = cl == NO_REGS ? -1 : ira_class_hard_regs[cl][0];
+ regno = reg_renumber[regno] >= 0 ? reg_renumber[regno] : cl == NO_REGS ? -1 : ira_class_hard_regs[cl][0];
}
if (regno >= 0 && ! FP_REGNO_P (regno))
{
@@ -10689,7 +10689,7 @@ rs6000_emit_move (rtx dest, rtx source,
{
cl = reg_preferred_class (regno);
gcc_assert (cl != NO_REGS);
- regno = ira_class_hard_regs[cl][0];
+ regno = reg_renumber[regno] >= 0 ? reg_renumber[regno] : ira_class_hard_regs[cl][0];
}
if (FP_REGNO_P (regno))
{
Index: testsuite/gcc.target/powerpc/pr79916.c
===================================================================
--- testsuite/gcc.target/powerpc/pr79916.c (nonexistent)
+++ testsuite/gcc.target/powerpc/pr79916.c (working copy)
@@ -0,0 +1,556 @@
+/* { dg-do compile { target { powerpc64le-*-* } } } */
+/* { dg-options "-Idfp -fno-expensive-optimizations --param ira-max-conflict-table-size=0 -mno-popcntd -O3" } */
+
+#define PASTE2(A,B) A ## B
+#define PASTE(A,B) PASTE2(A,B)
+
+#define TESTVAL_NEG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ si = VAL; \
+ sll = PASTE(VAL,LL); \
+ a = si; \
+ b = sll; \
+ c = VAL; \
+ d = PASTE(VAL,LL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&a, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&b,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&c,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&d,SIZE) != 0)) \
+ __builtin_abort ();
+
+#define TESTVAL_NEG_BIG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ sll = PASTE(VAL,LL); \
+ a = sll; \
+ b = PASTE(VAL,LL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&a, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&b,SIZE) != 0)) \
+ __builtin_abort ();
+
+#define TESTVAL_NONNEG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ si = VAL; \
+ ui = VAL; \
+ sll = PASTE(VAL,LL); \
+ ull = PASTE(VAL,ULL); \
+ a = si; \
+ b = sll; \
+ c = ui; \
+ d = ull; \
+ e = VAL; \
+ f = VAL; \
+ g = PASTE(VAL,LL); \
+ h = PASTE(VAL,ULL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&a, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&b,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&c,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&d,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&e,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&f,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&g,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&x, (void *)&h,SIZE) != 0)) \
+ __builtin_abort ();
+
+#define TESTVAL_NONNEG_BIG(VAL,SUF,SIZE) \
+ x = PASTE(PASTE(VAL,.),SUF); \
+ sll = PASTE(VAL,LL); \
+ ull = PASTE(VAL,ULL); \
+ b = sll; \
+ d = ull; \
+ f = PASTE(VAL,LL); \
+ g = PASTE(VAL,ULL); \
+ if ((__builtin_memcmp ((void *)&x, (void *)&b, SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&d, (void *)&d,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&f, (void *)&d,SIZE) != 0) \
+ || (__builtin_memcmp ((void *)&g, (void *)&d,SIZE) != 0)) \
+ __builtin_abort ();
+
+#undef SUFFIX
+#define SUFFIX DF
+#undef TYPE
+#define TYPE _Decimal32
+
+void
+zeroes_32 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000000, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000000, SUFFIX, sizeof (TYPE));
+}
+
+void
+round_32 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (10000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000050, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000010, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (-10000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000050, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000010, SUFFIX, sizeof (TYPE));
+}
+
+#undef SUFFIX
+#define SUFFIX DD
+#undef TYPE
+#define TYPE _Decimal64
+
+void
+zeroes_64 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000000, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000000, SUFFIX, sizeof (TYPE));
+}
+
+void
+round_64 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000010, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000001, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000002, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000003, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000004, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000049, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000051, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000006, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000007, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000008, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000009, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000010, SUFFIX, sizeof (TYPE));
+}
+
+#undef SUFFIX
+#define SUFFIX DL
+#undef TYPE
+#define TYPE _Decimal128
+
+void
+zeroes_128 (void)
+{
+ volatile TYPE x, a, b, c, d, e, f, g, h;
+ volatile int si;
+ volatile unsigned int ui;
+ volatile long long sll;
+ volatile unsigned long long ull;
+
+ TESTVAL_NONNEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG (1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NONNEG_BIG (9000000000000000000, SUFFIX, sizeof (TYPE));
+
+ TESTVAL_NEG (0, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-5000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-9000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-10000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-50000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-90000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-100000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-500000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-900000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG (-1000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-10000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-50000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-90000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-100000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-500000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-900000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-1000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-5000000000000000000, SUFFIX, sizeof (TYPE));
+ TESTVAL_NEG_BIG (-9000000000000000000, SUFFIX, sizeof (TYPE));
+}
+
+
+int
+main ()
+{
+ zeroes_32 ();
+ zeroes_64 ();
+ zeroes_128 ();
+ round_32 ();
+ round_64 ();
+
+ return 0;
+}
