The test vdiv_f.c #define's NAN to (0.0 / 0.0). This produces extra scalar
fdiv's, which complicate the scan-assembler testing. We can remove these by
using __builtin_nan instead.
Tested on AArch64 Linux.
gcc/testsuite/ChangeLog:
* gcc.target/aarch64/vdiv_f.c: Use __builtin_nan.
---
gcc/testsuite/gcc.target/aarch64/vdiv_f.c | 6 ++----
1 file changed, 2 insertions(+), 4 deletions(-)
diff --git a/gcc/testsuite/gcc.target/aarch64/vdiv_f.c
b/gcc/testsuite/gcc.target/aarch64/vdiv_f.c
index 45c72a9..a505e39 100644
--- a/gcc/testsuite/gcc.target/aarch64/vdiv_f.c
+++ b/gcc/testsuite/gcc.target/aarch64/vdiv_f.c
@@ -7,7 +7,7 @@
#define FLT_INFINITY (__builtin_inff ())
#define DBL_INFINITY (__builtin_inf ())
-#define NAN (0.0 / 0.0)
+#define NAN (__builtin_nan (""))
#define PI 3.141592653589793
#define PI_4 0.7853981633974483
@@ -228,9 +228,7 @@ test_vdiv_f64 ()
return 0;
}
-/* The following assembly should match 2 more times,
- in 64bit NAN generation. */
-/* { dg-final { scan-assembler-times "fdiv\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+"
3 } } */
+/* { dg-final { scan-assembler-times "fdiv\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+"
1 } } */
#undef TESTA8
#undef ANSW8
--
1.9.1
