https://gcc.gnu.org/bugzilla/show_bug.cgi?id=118597
--- Comment #10 from GCC Commits <cvs-commit at gcc dot gnu.org> --- The master branch has been updated by Victor Do Nascimento <victor...@gcc.gnu.org>: https://gcc.gnu.org/g:701bc728c31a84b6eff7d77f48c6ab270af007cf commit r15-9184-g701bc728c31a84b6eff7d77f48c6ab270af007cf Author: Victor Do Nascimento <victor.donascime...@arm.com> Date: Wed Apr 2 14:22:31 2025 +0100 vect: Relax scan-tree-dump strict pattern matching [PR118597] Using specific SSA names in pattern matching in `dg-final' makes tests "unstable", in that changes in passes prior to the pass whose dump is analyzed in the particular test may change the numbering of the SSA variables, causing the test to start failing spuriously. We thus switch from specific SSA names to the use of a multi-line regular expression making use of capture groups for matching particular variables across different statements, ensuring the test will pass more consistently across different versions of GCC. PR testsuite/118597 gcc/testsuite/ChangeLog: * gcc.dg/vect/vect-fncall-mask.c: Update test directives.
