https://gcc.gnu.org/bugzilla/show_bug.cgi?id=67110
--- Comment #2 from hjl at gcc dot gnu.org <hjl at gcc dot gnu.org> --- Author: hjl Date: Tue Aug 4 11:54:20 2015 New Revision: 226570 URL: https://gcc.gnu.org/viewcvs?rev=226570&root=gcc&view=rev Log: Compile IAMCU tests with -fno-pie -no-pie Since IAMCU tests clear all scratch integer registers with: asm __volatile__ ("xor %%eax, %%eax\n\t" \ "xor %%edx, %%edx\n\t" \ "xor %%ecx, %%ecx\n\t" \ ::: "eax", "edx", "ecx"); PIC register may be trashed between setting PIC register and using it. This patch compiles AMCU tests with -fno-pie -no-pie. PR target/67110 * gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add -fno-pie -no-pie. Modified: trunk/gcc/testsuite/ChangeLog trunk/gcc/testsuite/gcc.target/i386/iamcu/abi-iamcu.exp