https://gcc.gnu.org/bugzilla/show_bug.cgi?id=67110

--- Comment #2 from hjl at gcc dot gnu.org <hjl at gcc dot gnu.org> ---
Author: hjl
Date: Tue Aug  4 11:54:20 2015
New Revision: 226570

URL: https://gcc.gnu.org/viewcvs?rev=226570&root=gcc&view=rev
Log:
Compile IAMCU tests with -fno-pie -no-pie

Since IAMCU tests clear all scratch integer registers with:

  asm __volatile__ ("xor %%eax, %%eax\n\t" \
                    "xor %%edx, %%edx\n\t" \
                    "xor %%ecx, %%ecx\n\t" \
                    ::: "eax", "edx", "ecx");

PIC register may be trashed between setting PIC register and using it.
This patch compiles AMCU tests with -fno-pie -no-pie.

        PR target/67110
        * gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add
        -fno-pie -no-pie.

Modified:
    trunk/gcc/testsuite/ChangeLog
    trunk/gcc/testsuite/gcc.target/i386/iamcu/abi-iamcu.exp

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