lebedev.ri requested changes to this revision.
lebedev.ri added a comment.

In D140467#4010675 <https://reviews.llvm.org/D140467#4010675>, @pengfei wrote:

>> If it exists it must be tested.
>> Every piece of code generation needs to be tested.
>
> Let me show you the number:
>
>   $ grep -rho '__builtin_ia32\w\+' clang/test/CodeGen | sort|uniq |wc -l
>   337
>   $ grep -rho '_mm512_\w\+' clang/test/CodeGen | sort|uniq |wc -l
>   2304
>
> Note most of `__builtin_ia32` tests are negative ones and `_mm512_` is less 
> than 1/3 of the total x86 intrinsics. Two orders of magnitude!
>
> I took a look at the tests. The positive tests come from 
> clang/test/CodeGen/builtins-x86.c. Other targets don't have a big test either
> `wc -l clang/test/CodeGen/builtins-*`
>
>> These are not testing use of these builtins correctly
>
> As I have explained, users are not suggested to use these builtins given we 
> have provided the more stable, well documented corresponding intrinsics. The 
> only case user has to use it is the intrinsic is missing. In that case, we do 
> need test case for it.
>
> In a word, as titled, it is NFC from the perspective of intrinsics. So I 
> think we don't need test cases for them.
>
>> This test amounts to a builtin header test for immintrin.h. This should move 
>> to clang/test/Headers and replaced with a builtin test directly checking the 
>> builtin handling
>
> Not get your point. But currently no builtin tests under 
> `clang/test/Headers/`.

I agree with @arsenm. At least for clang irgen, we should have good test 
coverage.


Repository:
  rG LLVM Github Monorepo

CHANGES SINCE LAST ACTION
  https://reviews.llvm.org/D140467/new/

https://reviews.llvm.org/D140467

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