On Mon, Nov 26, 2007 at 12:27:03PM -0800, David Mathog wrote: > Anyway, this was the best test I could > find for detecting the occasional gamma ray type data loss event.
I always thought that the bit fade test was aimed at finding manufacturing defects and the like. > On the web there are references to an IBM study which found 1 bit > error/256Mb/Month, Note that the size of the memory chip plays into the rate, so you can't directly compare with that number. (bigger chip = higher rate, smaller fab process = lower rate, different fab process = different rate, etc.) -- greg _______________________________________________ Beowulf mailing list, Beowulf@beowulf.org To change your subscription (digest mode or unsubscribe) visit http://www.beowulf.org/mailman/listinfo/beowulf
